Speaker
Description
Only a limited number of experimental techniques can provide detailed information about interfaces under relevant working conditions, including controlled pressure, temperature, electrical potential, illumination, in the presence of gas or liquid environments. Among these, photoelectron spectroscopy, surface X-ray diffraction, and X-ray scattering techniques are particularly valuable for investigating complex interfacial systems. They provide complementary information on the chemical, electronic, and structural properties of the outermost atomic layers while enabling, in many cases, measurements under operando conditions.
In this talk, we will present the current and near-future capabilities available at the ALBA Synchrotron for performing these types of experiments, with particular emphasis on the experimental setups that enable the study of working interfaces under relevant environmental and electrochemical conditions. To illustrate these capabilities, we will discuss selected examples from different research areas, demonstrating how synchrotron-based techniques can provide unique insights into the structure, composition, and electronic properties of interfaces during operation. We will also highlight the advantages of combining complementary X-ray and photoelectron spectroscopy approaches to establish structure–property relationships and unravel the dynamic processes governing complex interfaces.