Spatially resolving X-ray methods have gained significant attraction over the last few years, largely due to the dramatic improvement of X-ray sources and enabling technologies such as focusing optics and detectors. X-ray diffraction-based imaging tools are of relevance for the characterization of most emerging nanomaterials or electronic devices. While typical samples for these techniques are microelectronic structures, the resolving power has proven to reach down to length scales relevant for catalysis and basic solid-state chemistry as encountered in most electrochemical systems. Beamline ID01 is specialized on the imaging of strain and structure under Bragg diffraction conditions. Most recent efforts show that high resolution in reciprocal and real space is now obtained on time scales allowing to follow operando in areas and on timescales ranging from Batteries (seconds to hours) down to sub nanosecond time resolved imaging of functioning electronic devices. Beyond new opportunities provided by storage ring upgrades and lower emittance, the evolution and diversification of imaging methods will evolve through further expected progress in optics and detectors but also by improvements of algorithms and breakthroughs in the handling of large data volumes.