Abstract:
Scanning transmission x-ray microscopy (STXM) is a synchrotron-based non-invasive x-ray microscopy technique that can be employed for the investigation of micro- and nanostructured materials. This technique combines a high spatial resolution (for soft x-rays on the order of 10-15 nm) with a high temporal resolution (depending on the filling pattern of the synchrotron light source, either on the order of 10 or 100 ps). Furthermore, thanks to the use of monochromatic x-rays as probing mechanism, element-sensitive imaging can be carried out with STXM. The typical soft x-ray photon energies available (between ca. 100 eV and 2000 eV) allow the investigation of both carbon-based systems (e.g. polymers) and metallic systems (e.g. based on 3d transition metals). Furthermore, the elemental sensitivity of this technique, combined with the x-ray magnetic circular dichroism (XMCD) effect, allows for the investigation of the local magnetic configuration of magnetic materials and multilayers with sub-μm spatial and sub-ns temporal resolution.
In this presentation, an overview of the PolLux and NanoXAS endstations of the Swiss Light Source, both equipped with a STXM, will be given. In particular, the FPGA-based time-resolved acquisition system installed at the PolLux endstation, which allows for the acquisition of time-resolved images with sub-ns temporal resolution, and the combined STXM-AFM installed at the NanoXAS beamline will be presented in detail.
Finally, two examples of projects that employed the instrumentation available at the PolLux/NanoXAS beamline will be presented: